![]() ![]() ![]() ![]() The pulse generators can be used to modulate devices under test (DUT) or one of a series of associated Modulation Test Sets also available. Industry-best capture time of 500 ms permits users to measure under long pulse repetition interval conditions or to conduct pulse-to-pulse measurements over an extended number of pulses.Īn additional, required, IF digitizer option provides fast digitization for the Pulse View application, as well as four internal pulse generators. It also enables users to see performance perturbations on the rising/trailing edges and within a pulse that have been previously missed by other systems. The industry-leading 2.5 ns resolution with 100 dB dynamic range, coupled with independent measurement gates, provides unparalleled clarity of results. Pulse View enables design engineers and component manufacturers in the aerospace and defense industry to accurately test and characterize designs under pulse conditions. ![]()
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